Analog and Mixed Signal Test: A Recent History
(Part of the SpringerBriefs in Electrical and Computer Engineering Series)
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This book serves as a "go-to" guide to the most important research in the last 20 years in analog and mixed-signal test. Topics covered include: analog Built-in Self-test, analog design-for-test, IEEE standards based test for analog and mixed-signal circuits, RF test, Data Converter (DAC/ADC) testing, automatic test equipment, alternate test, machine learning and big data solutions for analog/mixed-signal systems-on-chip. The author has designed the presentation so that readers can get up to speed quickly in the various cutting-edge topics in mixed signal research, or use the information as a guide for diving more deeply into the most relevant literature, without losing time.
Format:Paperback
Language:English
ISBN:3319211811
ISBN13:9783319211817
Release Date:December 2020
Publisher:Springer
Length:75 Pages
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