Analysis And Design Of Resilient Vlsi Circuits: Mitigating Soft Errors And Process Variations

By Sunil P. Khatri, Rajesh Garg, Sunil P Khatri

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Soft Errors.- Analytical Determination of Radiation-induced Pulse Width in Combinational Circuits.- Analytical Determination of the Radiation-induced Pulse Shape.- Modeling Dynamic Stability of SRAMs in the Presence of Radiation Particle Strikes.- 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits.- Clamping Diode-based Radiation Tolerant Circuit Design Approach.- Split-output-based Radiation Tolerant Circuit Design Approach.- Process Variations.- Sensitizable Statistical Timing Analysis.- A Variation Tolerant Combinational Circuit Design Approach Using Parallel Gates.- Process Variation Tolerant Single-supply True Voltage Level Shifter.- Conclusions and Future Directions.

Format:Hardcover

Language:English

ISBN:1441909303

ISBN13:9781441909305

Release Date:November 2009

Publisher:Springer

Length:212 Pages

Weight:1.12 lbs.

Dimensions:0.6" x 6.1" x 9.2"

Related Subjects

Computers Computers & Technology Engineering Technology

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Analysis And Design Of Resilient Vlsi Circuits: Mitigating Soft Errors And Process Variations

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