Defect Oriented Testing for CMOS Analog and Digital Circuits

by Manoj Sachdev

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Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality, and many factors have contributed to their industrial acceptance.... This description may be from another edition of this product.

Format:Hardcover

Language:English

ISBN:0792380835

ISBN13:9780792380832

Release Date:December 1997

Publisher:Kluwer Academic Publishers

Length:308 Pages

Related Subjects

Electrical & Electronic Engineering Electrical & Electronics Engineering Technology

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Defect Oriented Testing for CMOS Analog and Digital Circuits

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