Design, Analysis and Test of Logic Circuits Under Uncertainty

By John P. Hayes, Igor L. Markov, Smita Krishnaswamy

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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Format:Hardcover

Language:English

ISBN:9048196434

ISBN13:9789048196432

Release Date:September 2012

Publisher:Springer

Length:124 Pages

Weight:0.80 lbs.

Dimensions:0.5" x 6.0" x 9.2"

Related Subjects

Computers Computers & Technology Engineering Technology

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Design, Analysis and Test of Logic Circuits Under Uncertainty

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