Digital Integrated Circuit Testing from a Quality Perspective

by Eugene R. Hnatek

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Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the... This description may be from another edition of this product.

Format:Hardcover

Language:English

ISBN:0442006438

ISBN13:9780442006433

Release Date:August 1993

Publisher:Springer

Length:180 Pages

Weight:1.05 lbs.

Dimensions:0.7" x 6.2" x 9.7"

Related Subjects

Engineering Technology

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Digital Integrated Circuit Testing from a Quality Perspective

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