Digital System Verification: A Combined Formal Methods and Simulation Framework

by Mitchell A. Thornton, Lun Li, Mitchell Thornton

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Integrated circuit capacity follows Moore's law, and chips are commonly produced at the time of this writing with over 70 million gates per device. Ensuring correct functional behavior of such large... This description may be from another edition of this product.

Format:Paperback

Language:English

ISBN:160845178X

ISBN13:9781608451784

Release Date:February 2010

Publisher:Morgan & Claypool

Length:100 Pages

Weight:0.41 lbs.

Dimensions:0.2" x 7.5" x 9.3"

Related Subjects

Computers Computers & Technology Engineering Technology

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Digital System Verification: A Combined Formal Methods and Simulation Framework

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