Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories

by Kanad Chakraborty and Pinaki Mazumder

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All modern electronic systems have memory. Most often that memory is RAM, or random access memory. This text covers research topics in circuit and processing technologies, as relevant to RAM... This description may be from another edition of this product.

Format:Hardcover

Language:English

ISBN:0130084654

ISBN13:9780130084651

Release Date:January 2002

Publisher:Prentice Hall PTR

Length:426 Pages

Weight:1.85 lbs.

Dimensions:0.9" x 7.2" x 9.5"

Related Subjects

Computers Computers & Technology Engineering Technology

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Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories

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