High Resolution X-Ray Diffractometry And Topography
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Book Overview
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.
Format:Paperback
Language:English
ISBN:0367400634
ISBN13:9780367400637
Release Date:October 2019
Publisher:CRC Press
Length:264 Pages
Weight:0.95 lbs.
Dimensions:0.7" x 6.8" x 9.5"
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