Image Formation in Low-Voltage Scanning Electron Microscopy

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While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences... This description may be from another edition of this product.

Format:Hardcover

Language:English

ISBN:0819412066

ISBN13:9780819412065

Release Date:January 1993

Publisher:SPIE-International Society for Optical Engine

Length:143 Pages

Related Subjects

Engineering Science Science & Math Science & Scientists Science & Technology Technology

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Image Formation in Low-Voltage Scanning Electron Microscopy

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