Integrated Circuit Quality and Reliability

by Eugene R. Hnatek

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Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

Format:Hardcover

Language:English

ISBN:0824792831

ISBN13:9780824792831

Release Date:December 1994

Publisher:CRC Press

Length:808 Pages

Weight:1.55 lbs.

Dimensions:1.6" x 6.0" x 9.0"

Related Subjects

Engineering Technology

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