Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Analysis
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Book Overview
This book defines the application of Information Technology's systematic and automated knowledge mapping methodology to collect, analyze and report nanotechnology research on a global basis. It offers a systematic presentation of the state-of-the-art of nanotechnology. Coverage includes basic analysis, content analysis, and citation network analysis of comprehensive nanotechnology findings across technology domains, inventors, institutions, and countries. The book explores many sources in detail including, the nanotechnology patent and literature databases from the US patent Office (USPTO), the European Patent Office (EPO), and the Japanese Patent Office (JPO).
Format:Paperback
Language:English
ISBN:1461498279
ISBN13:9781461498278
Release Date:November 2014
Publisher:Springer
Length:330 Pages
Weight:1.09 lbs.
Dimensions:0.7" x 6.1" x 9.2"
Related Subjects
Business Business & Investing Computers Computers & Technology Economics Engineering TechnologyCustomer Reviews
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