Modeling Nanoscale Imaging in Electron Microscopy
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Book Overview
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Format:Paperback
Language:English
ISBN:1489997288
ISBN13:9781489997289
Release Date:April 2014
Publisher:Springer
Length:182 Pages
Weight:0.65 lbs.
Dimensions:0.5" x 5.9" x 9.0"
Related Subjects
Engineering Science Science & Math Science & Scientists Science & Technology TechnologyCustomer Reviews
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