Particle and Particle Systems Characterization: Small-Angle Scattering (Sas) Applications
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Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples.
Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications
is geared to any scientist who might want to apply SAS to study tightly packed particle ensembles using elements of stochastic geometry. After completing the book, the reader should be able to demonstrate detailed knowledge of the application of SAS for the characterization of physical and chemical materials.Format:Hardcover
Language:English
ISBN:1466581778
ISBN13:9781466581777
Release Date:November 2013
Publisher:CRC Press
Length:336 Pages
Weight:1.80 lbs.
Dimensions:1.3" x 6.2" x 9.2"
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Engineering Science Science & Math Science & Scientists Science & Technology TechnologyCustomer Reviews
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