Progress in Nanoscale Characterization and Manipulation
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Book Overview
Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials research
Showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy
Explores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniques
Format:Paperback
Language:English
ISBN:9811344205
ISBN13:9789811344206
Release Date:January 2019
Publisher:Springer
Length:508 Pages
Weight:1.58 lbs.
Dimensions:1.0" x 6.1" x 9.2"
Related Subjects
Engineering Science Science & Math Science & Scientists Science & Technology TechnologyCustomer Reviews
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