Reflection Electron Microscopy and Spectroscopy for Surface Analysis
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Book Overview
In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.
Format:Paperback
Language:English
ISBN:0521017955
ISBN13:9780521017954
Release Date:August 2005
Publisher:Cambridge University Press
Length:460 Pages
Weight:1.60 lbs.
Dimensions:0.9" x 6.7" x 9.6"
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