Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures

by Alexandre Schmid, Yusuf Leblebici, Milos Stanisavljevic

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Book Overview

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

Format:Paperback

Language:English

ISBN:148998254X

ISBN13:9781489982544

Release Date:October 2014

Publisher:Springer

Length:195 Pages

Weight:0.70 lbs.

Dimensions:0.5" x 6.1" x 9.2"

Related Subjects

Computers Computers & Technology Engineering Technology

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Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures

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