Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis
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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Format:Hardcover
Language:English
ISBN:184816789X
ISBN13:9781848167896
Release Date:June 2014
Publisher:Imperial College Press
Length:616 Pages
Weight:2.29 lbs.
Dimensions:1.3" x 6.1" x 9.0"
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Engineering Science Science & Math Science & Scientists Science & Technology TechnologyCustomer Reviews
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