Structural Analysis of Point Defects in Solids: An Introduction to Multiple Magnetic Resonance Spectroscopy
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Structural Analysis of Point Defects in Solids provides a comprehensive introduction to the principles and techiques of modern electron paramagnetic resonance spectroscopy applied to the determination of microscopic defect structures. It informs the nonspecialist about the potential of the different methods, while the researcher faced with the task of determining defect structures will find here the necessary tools. The book will be useful for materials scientists working in semiconductor physics, laser physics, radiation damage, etc., and also for mineralogists and solid state chemists.
Format:Paperback
Language:English
ISBN:3642844073
ISBN13:9783642844072
Release Date:January 2012
Publisher:Springer
Length:367 Pages
Weight:1.19 lbs.
Dimensions:0.8" x 6.1" x 9.2"
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Engineering Science Science & Math Science & Scientists Science & Technology TechnologyCustomer Reviews
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