Testing and Testable Design of High-Density Random-Access Memories

by Kanad Chakraborty and Pinaki Mazumder

No Customer Reviews

This volume deals with the study of fault modelling, testing and testable design of semiconductor random-access memories. It is written primarily for the practising design engineer and the... This description may be from another edition of this product.

Format:Hardcover

Language:English

ISBN:0792397827

ISBN13:9780792397823

Release Date:January 1996

Publisher:Springer

Length:386 Pages

Weight:1.94 lbs.

Dimensions:1.1" x 6.4" x 9.5"

Related Subjects

Computers Computers & Technology Engineering Technology

Customer Reviews

0 rating

Write a review

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Copyright © 2025 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Policy | Cookie Preferences | Accessibility Statement
ThriftBooks ^® and the ThriftBooks ^® logo are registered trademarks of Thrift Books Global, LLC

Testing and Testable Design of High-Density Random-Access Memories

Recommended

Customer Reviews

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

Follow Us