Transmission Electron Microscopy of Minerals and Rocks
(Part of the Cambridge Topics in Mineral Physics and Chemistry Series)
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Book Overview
Of the many techniques that have been applied to the study of crystal defects, none has contributed more to our understanding of their nature and influence on the physical and chemical properties of crystalline materials than transmission electron microscopy (TEM). TEM is now used extensively by an increasing number of earth scientists for direct observation of defect microstructures in minerals and rocks. Transmission Electron Microscopy of Minerals and Rocks is an introduction to the principles of the technique written specifically for geologists and mineralogists. The first part of the book deals with the essential physics of the transmission electron microscope and presents the basic theoretical background required for the interpretation of images and electron diffraction patterns. A knowledge of elementary crystallography is assumed, and some familiarity with optics and electromagnetic theory is helpful but not essential. The final chapters are concerned with specific applications of TEM in mineralogy and deal with such topics as planar defects, intergrowths, radiation-induced defects, dislocations and deformation-induced microstructures.
Format:Paperback
Language:English
ISBN:0521359430
ISBN13:9780521359436
Release Date:October 2005
Publisher:Cambridge University Press
Length:400 Pages
Weight:1.29 lbs.
Dimensions:0.9" x 6.0" x 9.0"
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